The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130 kV/10 watt Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high-resolution imaging chain.

Through a series of factory and field upgrades, the end-user can configure these systems to their own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology.

Benefits:
Proprietary 30-130 kv micro-focus source with 2μm feature recognition
True 72° manipulator tilting angle allows oblique viewing for easy inspection of internal features
Large measurement area of 520×520 mm
Intuitive joystick navigation drives real-time X-ray imaging
Dual display for combined measurement and real-time analysis
Low cost of ownership and maintenance with open-tube technology
Safety as a design criterion
CT and X.Tract (laminography) ready

Technology : X-ray
Sector : for the electronics industry
Applications : for printed circuit boards, for semiconductors
Other characteristics : measurement, high-resolution