High-performance premium nanofocus and microfocus inspection for electronics
NDT Electronics Inspection Solutions
Phoenix Microme|x Neo and Nanome|x Neo

The Phoenix Microme|x Neo and Nanome|x Neo provide high-resolution 2D X-ray technology, PlanarCT and 3D computed tomography( CT) scanning in one system, enabling non-destructive testing (NDT) of electronic components – such as semiconductors, PCBs, lithium-ion batteries – in industrial, automotive, aviation and consumer electronics industries. With innovative engineering coupled with ultra-high positioning accuracy, Phoenix Microme|x Neo and Nanome|x Neo are ideally suited for industrial X-ray electronics inspections in process and quality control for greater productivity, failure analysis for the increased safety and quality of your products, and R&D where innovations are born.

Phoenix Microme|x Neo and Nanome|x Neo – Key Features

Brilliant DXR-HD live imaging

Waygate Technologies´ exclusive brilliant DXR-HD detector fleet includes:

1) The newest large-size DXR S100 Pro detector – superior pixel resolution defining industry-leading imaging technology:

Provides superior 100 um pixel resolution and frame rates up to 30 frames per second which combines outstanding detectability with high efficiency
300 mm x 250 mm large active area significantly expands the vision and redefines inspection efficiency

2) Exclusive high dynamic DXR250RT detector – enhanced scintillator technology introduces a new industry standard for efficient live inspection:

Technology : X-ray, CT, NDT
Sector : industrial, for the electronics industry, for the automotive industry, for the aerospace industry
Applications : for printed circuit boards, for semiconductors
Other characteristics : high-resolution