The NanoCam Sq dynamic optical profiler measures surface roughness on small and large optical quality surfaces. The non-contact NanoCam Sq replaces slow, messy replication methods required with traditional workstation optical profilers.

By enabling on-machine roughness metrology the NanoCam Sq increases throughput and reduces the risk of damage to expensive, mission-critical optics.

NanoCam Sq measuring roughness of large mirror. Courtesy Optical Surface Technologies, Albuquerque, NM.

The NanoCam Sq profilometer utilizes Dynamic Interferometry®, incorporating a high-speed optical sensor that measures thousands of times faster than typical profilers. Because acquisition time is so short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on gantries or on robots. This freedom of positioning means that the instrument can measure any location on the surface of a large optic, and that the optic can be located anywhere, including on polishing equipment.

Technology : optical
Function : flatness, roughness
Other characteristics : non-contact