Item No.: W1
Product name: SuperView W1 for Nano 3D Surface and Form
Standard field of view： ( 0.49*0.49 ) mm
Max field of view: ( 6×6 ) mm
Reflectivity of test object:0.5 % ~100 %
Repeatability of Roughness RMS:0.005nm
Scanning range:≤10mm
Resolution:0.1nm
Accuracy of stage measurement:0.3 %
Repeatability of stage measurement: 0.08% 1σ
X, Y Object table ：
Size： ( 320×200 ) mm
Moving range： ( 140×110 ) mm
Load capacity：10kg
Control method：Motorized
Description
SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning module and 3D modeling algorithm, it contactlessly scans the surface of the object then establish a 3D image for the surface. A serial of 2D, 3D parameters reflecting surface quality of the object are obtained after XtremeVision software processes and analyzes the 3D image.
The SuperView W1 is a user-friendly precision optical instrument with powerful analysis functions for all kinds of surface form & roughness parameters. With unique light source it could measure various precision parts with both smooth and rough surface.
Applications
It is used for measurement and analysis of surface roughness and profile of precision components from industries of semi-conductor, 3C Electronics, ultraprecise machining, optical machining, micro-nano materials, micro-electro-mechanical system.
Technology : 3D
Function : roughness
Applications : for semiconductors, industrial
Configuration : benchtop
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