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HomeMetrology - LaboratoryMetrology and Test Equipment3D scanner 3D scanning systemVS-STYLUS
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Thin-layer chromatography scannerDual Scan-RAM™

3D scanning systemVS-STYLUS

Princeton Applied Research | USA – Tennessee |

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Categories: 3D scanner, Metrology - Laboratory, Metrology and Test Equipment
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Description

In collaboration with SENSàSION, we are pleased to offer the Soft Stylus Probe contact mode technique developed by Professor Hubert Girault and co-workers of the Laboratory of Physical and Analytical Electrochemistry (LEPA) at the École Polytechnique Fédérale de Lausanne (EPFL) for constant distance SECM. The probe technology offers the following benefits:

• Constant distance SECM: SECM imaging without major topographic artifacts. Ideal for tilted, corrugated and rough samples.
• Soft contact with sample: with a contact force up to 1000 times less than hard probe technology, soft probes are ideal for studying biological samples in constant distance mode SECM.
• Low cost: no need for additional hardware and special feedback control electronics to control vertical position of the probe with respect to the sample. Lowest cost constant distance SECM method available on the market
• Faster measurements: no need to measure topography before SECM scans. Fast approach curve to find the sample surface.
• Flexible and stable Probes: no risk of damaging the probe or sample during positioning and scanning.
• Small tip-to-substrate distance is easily achieved, greatly enhancing contrast imaging and improving image resolution.
• Easy Electrode Preparation: The tip of the electrodes can be cut after each use ensuring a clean surface. Replacement probes can be purchased.

Number of axes : 3D
Technology : electrochemical

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09121572850

02166412312

02166981756

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