The WaveMaster® Compact is used in the quality control of plano, spherical and aspherical optics and is also suitable for simple development tasks. It is a quick and precise instrument that operates according to the Shack-Hartmann principle. Handling is easy and optimized for high sample throughput.

Key Features

Fast and easy adaptation for change of different sample types, exchangeable imaging telescopes in kinematic mount
High measurement speed enables high sample throughput
High precision four axes alignment sample holder for submicron position adjustment.
Alignment compensation: Only minimum amount of sample alignment necessary when measuring series of samples
High accuracy
Automatic focusing
The automatic positioning of the wavefront sensor and the telescope in the exit pupil
Real time comparison with wavefront data from master lenses or design files
Point light source with different numerical apertures available (up to 0.95)
Vibration insensitive
Comprehensive software

Applications

The WaveMaster® Compact uses its built-in Shack-Hartmann sensor to determine the following parameters:

Measurement of the wavefront (PV, RMS)
Determination of the Zernike coefficients
Measurement of the Point Spread Function (PSF)
Measurement of the Modulation Transfer Function (MTF)
Measurement of the Strehl ratio
Wedge angle

Options : wavefront division