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HomeProduction MachinesOther Manufacturing EquipmentOptical microscope Optical microscopeEclipse LV100ND
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Optical microscopeEclipse LV100ND

Nikon Metrology | Belgium |

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Categories: Optical microscope, Other Manufacturing Equipment, Production Machines
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Description

The LV100ND series includes manual (LV100ND) and motorised (LV100NDA) microscope systems with both episcopic and diascopic illumination capability for materials inspection in research and development activities.

Example applications include, semiconductor devices, packaging, Flat panel display (FPD), electronic components, innovative materials, and precision molds by using dedicated episcopic and diascopic contrast techniques as required.

The LV100ND and LV100NDA capabilities

The universal microscope concept allows the widest range of complementary optical contrast techniques, and varying sample dimension all together on one microscope stand thanks to the modular component program.

Superb optics provide excellent images to both eyepieces and Nikon Metrology’s digital imaging cameras and analysis software.

Type : optical
Technical applications : laboratory, measuring, inspection, industrial, metallurgical, for materials research, medical, for quality control, for non-metallic inclusion inspection, 3-axis non-contact measuring, for thin-film measurements, multipurpose, for in-line wafer inspection, depth measurement
Ergonomics : upright
Microscope head : binocular, trinocular
Observation technique : bright field, fluorescence, phase contrast, dark field, polarized, infrared, differential interference contrast
Configuration : benchtop
Light source : LED illumination, with coaxial illumination
Other characteristics : ergonomic, digital camera, high-resolution, high-precision, 3-axis, for polished samples, motorized, low-temperature, high-magnification, automated, fiber optic inspection, with light intensity manager, scanning acoustic, with special lighting, variable temperature, USB, modular, image capture, for integration microscope and profilometer, asbestos identification, for wafers, long working distance, topography, high-contrast, high-definition, sliding-stage, image-processing, with white light interferometry-based metrology system, real-time, cost-effective, for nanotechnology, for flat samples, for semiconductors, simple installation

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Tehran, Imam Khomeini St., Vali Asr Intersection, Fajr Passage, Second Floor, No. 203

09121572850

02166412312

02166981756

info@ogips.com

2017 All rights reserved for OGIPS Holding Company
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