The new SPECTRO ARCOS ICP-OES analyzer represents a new pinnacle of productivity and performance for inductively coupled plasma optical emission spectrometers
OVERVIEW
One instrument instead of two: Only MultiView plasma instrument in the market ‒ true axial AND true radial plasma observation in a single instrument
ORCA Optical System: Simultaneous spectrum capture in the 130-770 nm wavelength range with up to 5x more sensitivity than Echelle based systems – delivers best in class performance in the UV/VUV range
LDMOS Generator: Up to 2000 W power and robust enough to handle volatile organics and high dissolved solids with ease
The SPECTRO ARCOS ICP-OES excels in industrial and academic applications for the most advanced elemental analysis of metals, chemicals, petrochemicals, and other materials.
The periscope-free MultiView mechanism lets an operator literally “turn” a radial-view instrument into an axial-view device, or vice-versa, in 90 seconds or less.
The design of the SPECTRO ARCOS ensures exceptionally low operating costs over a long, reliable service life. And it packs a modern, ergonomic chassis with proven features such as no-purge UV-PLUS sealed gas purification technology, no-external-cooling OPI-Air Interface.
Type : optical emission, ICP-OES
Field : laboratory, industrial
Configuration : compact
Detector type : CCD
Other characteristics : robust
Wavelength : Min.:
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